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|Title:||SEU simulation by fault injection in PSoC device: Preliminary results||Authors:||Mansour, Wassim
El Falou, Wassim
|Affiliations:||Department of Computer Engineering||Keywords:||Hardware-software codesign
|Subjects:||Systems on a chip||Issue Date:||2013||Publisher:||IEEE||Part of:||2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)||Conference:||International Conference on Advances in Computational Tools for Engineering Applications (ACTEA) (2nd : 12-15 Dec 2012 : Beirut, Lebanon)||Abstract:||
In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.
|URI:||https://scholarhub.balamand.edu.lb/handle/uob/811||Ezproxy URL:||Link to full text||Type:||Conference Paper|
|Appears in Collections:||Department of Computer Engineering|
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