Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/811
Title: SEU simulation by fault injection in PSoC device: Preliminary results
Authors: Mansour, Wassim
Velazco, Raoul
El Falou, Wassim
Ayoubi, Rafic 
Affiliations: Department of Computer Engineering 
Keywords: Hardware-software codesign
Matrix multiplication
Microprocessor chips
Programmable circuits
Subjects: Systems on a chip
Issue Date: 2013
Publisher: IEEE
Part of: 2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)
Conference: International Conference on Advances in Computational Tools for Engineering Applications (ACTEA) (2nd : 12-15 Dec 2012 : Beirut, Lebanon) 
Abstract: 
In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.
URI: https://scholarhub.balamand.edu.lb/handle/uob/811
Ezproxy URL: Link to full text
Type: Conference Paper
Appears in Collections:Department of Computer Engineering

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