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Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/811
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dc.contributor.authorMansour, Wassimen_US
dc.contributor.authorVelazco, Raoulen_US
dc.contributor.authorEl Falou, Wassimen_US
dc.contributor.authorAyoubi, Raficen_US
dc.date.accessioned2020-12-23T08:37:31Z-
dc.date.available2020-12-23T08:37:31Z-
dc.date.issued2013-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/811-
dc.description.abstractIn this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.subjectHardware-software codesignen_US
dc.subjectMatrix multiplicationen_US
dc.subjectMicroprocessor chipsen_US
dc.subjectProgrammable circuitsen_US
dc.subject.lcshSystems on a chipen_US
dc.titleSEU simulation by fault injection in PSoC device: Preliminary resultsen_US
dc.typeConference Paperen_US
dc.relation.conferenceInternational Conference on Advances in Computational Tools for Engineering Applications (ACTEA) (2nd : 12-15 Dec 2012 : Beirut, Lebanon)en_US
dc.contributor.affiliationDepartment of Computer Engineeringen_US
dc.date.catalogued2018-01-10-
dc.description.statusPublisheden_US
dc.identifier.ezproxyURLhttp://ezsecureaccess.balamand.edu.lb/login?url=http://ieeexplore.ieee.org/document/6462894/en_US
dc.identifier.OlibID176019-
dc.relation.ispartoftext2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)en_US
dc.provenance.recordsourceOliben_US
crisitem.author.parentorgFaculty of Engineering-
Appears in Collections:Department of Computer Engineering
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