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UOB Libraries created the UOBScholar Hub, an Institutional Repository (IR) for archiving and collecting all the research output of the UOB community. It aims to improve the visibility, usage and impact of research conducted at UOB. Materials included are: academic journal articles, conference papers and presentations, books and book chapters, ongoing research papers, reports and patents.
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https://scholarhub.balamand.edu.lb/handle/uob/810| Title: | SEU fault-injection at system level: method, tools and preliminary results | Authors: | Mansour, Wassim Ramos, Pablo Ayoubi, Rafic |
Affiliations: | Department of Computer Engineering | Keywords: | Radiation hardening (electronics) Fault tolerance Integrated circuit manufacture Integrated circuit reliability Matrix multiplication |
Issue Date: | 2014 | Publisher: | IEEE | Part of: | 15th Latin American Test Workshop - LATW | Conference: | Latin American Test Workshop (LATW) (15th : 12-15 March 2014 : Fortaleza, Brazil) | Abstract: | An approach to study the effects of single event upsets (SEU) by fault injection performed at system-level is presented. It is illustrated by results obtained on two different versions of a matrix multiplication algorithm, one standard and the second with fault tolerance capabilities. The final goal of this work is to validate fault tolerance techniques implemented at software level and provide a feedback about the weakest variables, improving thus their capabilities to tolerate faults. |
URI: | https://scholarhub.balamand.edu.lb/handle/uob/810 | Ezproxy URL: | Link to full text | Type: | Conference Paper |
| Appears in Collections: | Department of Computer Engineering |
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