Please use this identifier to cite or link to this item:
|Title:||SEU fault-injection at system level : Method, tools and preliminary results||Authors:||Mansour, Wassim
|Affiliations:||Department of Computer Engineering||Keywords:||Radiation hardening (electronics)
Integrated circuit manufacture
Integrated circuit reliability
|Issue Date:||2014||Publisher:||IEEE||Part of:||15th Latin American Test Workshop - LATW||Conference:||Latin American Test Workshop (LATW) (15th : 12-15 March 2014 : Fortaleza, Brazil)||Abstract:||
An approach to study the effects of single event upsets (SEU) by fault injection performed at system-level is presented. It is illustrated by results obtained on two different versions of a matrix multiplication algorithm, one standard and the second with fault tolerance capabilities. The final goal of this work is to validate fault tolerance techniques implemented at software level and provide a feedback about the weakest variables, improving thus their capabilities to tolerate faults.
|URI:||https://scholarhub.balamand.edu.lb/handle/uob/810||Ezproxy URL:||Link to full text||Type:||Conference Paper|
|Appears in Collections:||Department of Computer Engineering|
Show full item record
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.