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Title: SEU fault-injection at system level : Method, tools and preliminary results
Authors: Mansour, Wassim
Ramos, Pablo
Ayoubi, Rafic 
Affiliations: Department of Computer Engineering 
Keywords: Radiation hardening (electronics)
Fault tolerance
Integrated circuit manufacture
Integrated circuit reliability
Matrix multiplication
Issue Date: 2014
Publisher: IEEE
Part of: 15th Latin American Test Workshop - LATW
Conference: Latin American Test Workshop (LATW) (15th : 12-15 March 2014 : Fortaleza, Brazil) 
An approach to study the effects of single event upsets (SEU) by fault injection performed at system-level is presented. It is illustrated by results obtained on two different versions of a matrix multiplication algorithm, one standard and the second with fault tolerance capabilities. The final goal of this work is to validate fault tolerance techniques implemented at software level and provide a feedback about the weakest variables, improving thus their capabilities to tolerate faults.
Ezproxy URL: Link to full text
Type: Conference Paper
Appears in Collections:Department of Computer Engineering

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