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dc.contributor.authorMansour, Wassimen_US
dc.contributor.authorRamos, Pabloen_US
dc.contributor.authorAyoubi, Raficen_US
dc.description.abstractAn approach to study the effects of single event upsets (SEU) by fault injection performed at system-level is presented. It is illustrated by results obtained on two different versions of a matrix multiplication algorithm, one standard and the second with fault tolerance capabilities. The final goal of this work is to validate fault tolerance techniques implemented at software level and provide a feedback about the weakest variables, improving thus their capabilities to tolerate faults.en_US
dc.subjectRadiation hardening (electronics)en_US
dc.subjectFault toleranceen_US
dc.subjectIntegrated circuit manufactureen_US
dc.subjectIntegrated circuit reliabilityen_US
dc.subjectMatrix multiplicationen_US
dc.titleSEU fault-injection at system level : Method, tools and preliminary resultsen_US
dc.typeConference Paperen_US
dc.relation.conferenceLatin American Test Workshop (LATW) (15th : 12-15 March 2014 : Fortaleza, Brazil)en_US
dc.contributor.affiliationDepartment of Computer Engineeringen_US
dc.relation.ispartoftext15th Latin American Test Workshop - LATWen_US
Appears in Collections:Department of Computer Engineering
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