Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/810
DC FieldValueLanguage
dc.contributor.authorMansour, Wassimen_US
dc.contributor.authorRamos, Pabloen_US
dc.contributor.authorAyoubi, Raficen_US
dc.date.accessioned2020-12-23T08:37:30Z-
dc.date.available2020-12-23T08:37:30Z-
dc.date.issued2014-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/810-
dc.description.abstractAn approach to study the effects of single event upsets (SEU) by fault injection performed at system-level is presented. It is illustrated by results obtained on two different versions of a matrix multiplication algorithm, one standard and the second with fault tolerance capabilities. The final goal of this work is to validate fault tolerance techniques implemented at software level and provide a feedback about the weakest variables, improving thus their capabilities to tolerate faults.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.subjectRadiation hardening (electronics)en_US
dc.subjectFault toleranceen_US
dc.subjectIntegrated circuit manufactureen_US
dc.subjectIntegrated circuit reliabilityen_US
dc.subjectMatrix multiplicationen_US
dc.titleSEU fault-injection at system level : Method, tools and preliminary resultsen_US
dc.typeConference Paperen_US
dc.relation.conferenceLatin American Test Workshop (LATW) (15th : 12-15 March 2014 : Fortaleza, Brazil)en_US
dc.contributor.affiliationDepartment of Computer Engineeringen_US
dc.date.catalogued2018-01-10-
dc.description.statusPublisheden_US
dc.identifier.ezproxyURLhttp://ezsecureaccess.balamand.edu.lb/login?url=http://ieeexplore.ieee.org/document/6841907/en_US
dc.identifier.OlibID176015-
dc.relation.ispartoftext15th Latin American Test Workshop - LATWen_US
dc.provenance.recordsourceOliben_US
Appears in Collections:Department of Computer Engineering
Show simple item record

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.