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UOB Libraries created the UOBScholar Hub, an Institutional Repository (IR) for archiving and collecting all the research output of the UOB community. It aims to improve the visibility, usage and impact of research conducted at UOB. Materials included are: academic journal articles, conference papers and presentations, books and book chapters, ongoing research papers, reports and patents.
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https://scholarhub.balamand.edu.lb/handle/uob/810| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Mansour, Wassim | en_US |
| dc.contributor.author | Ramos, Pablo | en_US |
| dc.contributor.author | Ayoubi, Rafic | en_US |
| dc.date.accessioned | 2020-12-23T08:37:30Z | - |
| dc.date.available | 2020-12-23T08:37:30Z | - |
| dc.date.issued | 2014 | - |
| dc.identifier.uri | https://scholarhub.balamand.edu.lb/handle/uob/810 | - |
| dc.description.abstract | An approach to study the effects of single event upsets (SEU) by fault injection performed at system-level is presented. It is illustrated by results obtained on two different versions of a matrix multiplication algorithm, one standard and the second with fault tolerance capabilities. The final goal of this work is to validate fault tolerance techniques implemented at software level and provide a feedback about the weakest variables, improving thus their capabilities to tolerate faults. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | IEEE | en_US |
| dc.subject | Radiation hardening (electronics) | en_US |
| dc.subject | Fault tolerance | en_US |
| dc.subject | Integrated circuit manufacture | en_US |
| dc.subject | Integrated circuit reliability | en_US |
| dc.subject | Matrix multiplication | en_US |
| dc.title | SEU fault-injection at system level: method, tools and preliminary results | en_US |
| dc.type | Conference Paper | en_US |
| dc.relation.conference | Latin American Test Workshop (LATW) (15th : 12-15 March 2014 : Fortaleza, Brazil) | en_US |
| dc.contributor.affiliation | Department of Computer Engineering | en_US |
| dc.date.catalogued | 2018-01-10 | - |
| dc.description.status | Published | en_US |
| dc.identifier.ezproxyURL | http://ezsecureaccess.balamand.edu.lb/login?url=http://ieeexplore.ieee.org/document/6841907/ | en_US |
| dc.identifier.OlibID | 176015 | - |
| dc.relation.ispartoftext | 15th Latin American Test Workshop - LATW | en_US |
| dc.provenance.recordsource | Olib | en_US |
| Appears in Collections: | Department of Computer Engineering | |
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