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Title: | A method and an automated tool to perform SET fault-injection on HDL-based designs | Authors: | Mansour, Wassim Velazco, Raoul Ayoubi, Rafic |
Affiliations: | Department of Computer Engineering | Keywords: | Transients Neural nets Radiation hardening (electronics) |
Issue Date: | 2013 | Publisher: | IEEE | Part of: | 2013 25th International Conference on Microelectronics (ICM) | Conference: | International Conference on Microelectronics (ICM) (25th : 15-18 Dec. 2013 : Beirut, Lebanon) | Abstract: | A fully automated fault-injection method is presented. It deals with transient faults resulting from the impact of energetic particles and it can be applied early at design phase, on any circuit for which the register transfer level model is available. Results issued from its application to an Artificial Neural Network benchmark application put in evidence the accuracy of the studied method to predict error rates due to transient faults generated by the radiation environment. |
URI: | https://scholarhub.balamand.edu.lb/handle/uob/677 | Ezproxy URL: | Link to full text | Type: | Conference Paper |
Appears in Collections: | Department of Computer Engineering |
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