Please use this identifier to cite or link to this item:
|Title:||A method and an automated tool to perform SET fault-injection on HDL-based designs||Authors:||Mansour, Wassim
|Affiliations:||Department of Computer Engineering||Keywords:||Transients
Radiation hardening (electronics)
|Issue Date:||2013||Publisher:||IEEE||Part of:||2013 25th International Conference on Microelectronics (ICM)||Conference:||International Conference on Microelectronics (ICM) (25th : 15-18 Dec. 2013 : Beirut, Lebanon)||Abstract:||
A fully automated fault-injection method is presented. It deals with transient faults resulting from the impact of energetic particles and it can be applied early at design phase, on any circuit for which the register transfer level model is available. Results issued from its application to an Artificial Neural Network benchmark application put in evidence the accuracy of the studied method to predict error rates due to transient faults generated by the radiation environment.
|URI:||https://scholarhub.balamand.edu.lb/handle/uob/677||Ezproxy URL:||Link to full text||Type:||Conference Paper|
|Appears in Collections:||Department of Computer Engineering|
Show full item record
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.