Please use this identifier to cite or link to this item:
Title: A method and an automated tool to perform SET fault-injection on HDL-based designs
Authors: Mansour, Wassim
Velazco, Raoul
Ayoubi, Rafic 
Affiliations: Department of Computer Engineering 
Keywords: Transients
Neural nets
Radiation hardening (electronics)
Issue Date: 2013
Publisher: IEEE
Part of: 2013 25th International Conference on Microelectronics (ICM)
Conference: International Conference on Microelectronics (ICM) (25th : 15-18 Dec. 2013 : Beirut, Lebanon) 
A fully automated fault-injection method is presented. It deals with transient faults resulting from the impact of energetic particles and it can be applied early at design phase, on any circuit for which the register transfer level model is available. Results issued from its application to an Artificial Neural Network benchmark application put in evidence the accuracy of the studied method to predict error rates due to transient faults generated by the radiation environment.
Ezproxy URL: Link to full text
Type: Conference Paper
Appears in Collections:Department of Computer Engineering

Show full item record

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.