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UOB Libraries created the UOBScholar Hub, an Institutional Repository (IR) for archiving and collecting all the research output of the UOB community. It aims to improve the visibility, usage and impact of research conducted at UOB. Materials included are: academic journal articles, conference papers and presentations, books and book chapters, ongoing research papers, reports and patents.
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https://scholarhub.balamand.edu.lb/handle/uob/677| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Mansour, Wassim | en_US |
| dc.contributor.author | Velazco, Raoul | en_US |
| dc.contributor.author | Ayoubi, Rafic | en_US |
| dc.date.accessioned | 2020-12-23T08:34:54Z | - |
| dc.date.available | 2020-12-23T08:34:54Z | - |
| dc.date.issued | 2013 | - |
| dc.identifier.uri | https://scholarhub.balamand.edu.lb/handle/uob/677 | - |
| dc.description.abstract | A fully automated fault-injection method is presented. It deals with transient faults resulting from the impact of energetic particles and it can be applied early at design phase, on any circuit for which the register transfer level model is available. Results issued from its application to an Artificial Neural Network benchmark application put in evidence the accuracy of the studied method to predict error rates due to transient faults generated by the radiation environment. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | IEEE | en_US |
| dc.subject | Transients | en_US |
| dc.subject | Neural nets | en_US |
| dc.subject | Radiation hardening (electronics) | en_US |
| dc.title | A method and an automated tool to perform SET fault-injection on HDL-based designs | en_US |
| dc.type | Conference Paper | en_US |
| dc.relation.conference | International Conference on Microelectronics (ICM) (25th : 15-18 Dec. 2013 : Beirut, Lebanon) | en_US |
| dc.contributor.affiliation | Department of Computer Engineering | en_US |
| dc.date.catalogued | 2018-01-10 | - |
| dc.description.status | Published | en_US |
| dc.identifier.ezproxyURL | http://ezsecureaccess.balamand.edu.lb/login?url=http://ieeexplore.ieee.org/abstract/document/6734986/ | en_US |
| dc.identifier.OlibID | 176016 | - |
| dc.relation.ispartoftext | 2013 25th International Conference on Microelectronics (ICM) | en_US |
| dc.provenance.recordsource | Olib | en_US |
| crisitem.author.parentorg | Faculty of Engineering | - |
| Appears in Collections: | Department of Computer Engineering | |
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