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|Title:||The early stages of Saccharomyces cerevisiae yeast suspensions damage in moderate pulsed electric fields||Authors:||Zakhem, Henri El
Lebovka, Nikolai I.
|Affiliations:||Department of Chemical Engineering||Keywords:||Saccharomyces cerevisiae
|Subjects:||Conductivity||Issue Date:||2006||Part of:||Colloids & surface B: biointerfaces||Volume:||47||Issue:||2||Start page:||189||End page:||197||Abstract:||
The objectives of this study were to investigate the effects of pulsed electric fields (PEF) application to colloidal suspension of Saccharomyces cerevisiae. The electrical conductivity measurements during the PEF-treatment of S. cerevisiae suspensions were used to monitor the extent of cell damages in the intervals of electric field strength E = 3–15 kV/cm and time of PEF treatment tPEF = 10−4 to 1 s. At relatively small fields (E < 7.5 kV/cm) the early stages of yeast cells damages were observed. At such treatment conditions, the damage was incomplete and developed at long time of PEF treatment, below the value of E = 7.5 kV/cm which is commonly referred in literature as a threshold for this culture. Data obtained for the disintegration in conductivity experiments were found in good correlation with direct counting of yeast lethality using light microscopy. The PEF-induced lethality of the yeast cells and size flocs increased with the mixing of suspensions and the increase of temperature.
|URI:||https://scholarhub.balamand.edu.lb/handle/uob/1880||DOI:||10.1016/j.colsurfb.2005.12.010||Ezproxy URL:||Link to full text||Type:||Journal Article|
|Appears in Collections:||Department of Chemical Engineering|
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