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Title: The early stages of Saccharomyces cerevisiae yeast suspensions damage in moderate pulsed electric fields
Authors: Zakhem, Henri El 
Lanoisellé, Jean-Louis
Lebovka, Nikolai I.
Nonus, Maurice
Vorobiev, Eugene
Affiliations: Department of Chemical Engineering 
Keywords: Saccharomyces cerevisiae
Subjects: Conductivity
Issue Date: 2006
Part of: Colloids & surface B: biointerfaces
Volume: 47
Issue: 2
Start page: 189
End page: 197
The objectives of this study were to investigate the effects of pulsed electric fields (PEF) application to colloidal suspension of Saccharomyces cerevisiae. The electrical conductivity measurements during the PEF-treatment of S. cerevisiae suspensions were used to monitor the extent of cell damages in the intervals of electric field strength E = 3–15 kV/cm and time of PEF treatment tPEF = 10−4 to 1 s. At relatively small fields (E < 7.5 kV/cm) the early stages of yeast cells damages were observed. At such treatment conditions, the damage was incomplete and developed at long time of PEF treatment, below the value of E = 7.5 kV/cm which is commonly referred in literature as a threshold for this culture. Data obtained for the disintegration in conductivity experiments were found in good correlation with direct counting of yeast lethality using light microscopy. The PEF-induced lethality of the yeast cells and size flocs increased with the mixing of suspensions and the increase of temperature.
DOI: 10.1016/j.colsurfb.2005.12.010
Ezproxy URL: Link to full text
Type: Journal Article
Appears in Collections:Department of Chemical Engineering

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