Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/774
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dc.contributor.authorTohme, Elie Tonien_US
dc.contributor.authorOuvrard, Regisen_US
dc.contributor.authorTrigeassou, Jean Claudeen_US
dc.contributor.authorAbche, Antoineen_US
dc.date.accessioned2020-12-23T08:36:50Z-
dc.date.available2020-12-23T08:36:50Z-
dc.date.issued2006-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/774-
dc.description.abstractIn this work, a new off-line optimization approach is proposed to improve the global convergence. This algorithm, called pseudo-output error algorithm, is based on the introduction of a stationary filter in the sensitivity functions of the Newton algorithm. The convergence of the proposed algorithm is studied and analyzed. A comparison with Newton algorithm is performed to evaluate its performance. The results of the simulations show that the pseudo-output error algorithm converges to true parameters describing the system to be identified. Whereas, the Newton algorithm might converge to a secondary minimum for the same input-output data and initialized parameters.en_US
dc.format.extent6 p.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.subjectSensitivity analysisen_US
dc.subjectConvergence of numerical methodsen_US
dc.subjectFiltering theoryen_US
dc.subjectNewton methoden_US
dc.titleA pseudo-output error algorithm to improve global convergenceen_US
dc.typeConference Paperen_US
dc.relation.conferenceAnnual Conference of IEEE Industrial Electronics (32nd : 6-10 Nov. 2006 : Paris, France)en_US
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.description.startpage659en_US
dc.description.endpage664en_US
dc.date.catalogued2018-05-22-
dc.description.statusPublisheden_US
dc.identifier.ezproxyURLhttp://ezsecureaccess.balamand.edu.lb/login?url=https://ieeexplore.ieee.org/document/4153308/en_US
dc.identifier.OlibID180498-
dc.relation.ispartoftextIECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics,en_US
dc.provenance.recordsourceOliben_US
Appears in Collections:Department of Electrical Engineering
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