Please use this identifier to cite or link to this item:
https://scholarhub.balamand.edu.lb/handle/uob/774
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tohme, Elie Toni | en_US |
dc.contributor.author | Ouvrard, Regis | en_US |
dc.contributor.author | Trigeassou, Jean Claude | en_US |
dc.contributor.author | Abche, Antoine | en_US |
dc.date.accessioned | 2020-12-23T08:36:50Z | - |
dc.date.available | 2020-12-23T08:36:50Z | - |
dc.date.issued | 2006 | - |
dc.identifier.uri | https://scholarhub.balamand.edu.lb/handle/uob/774 | - |
dc.description.abstract | In this work, a new off-line optimization approach is proposed to improve the global convergence. This algorithm, called pseudo-output error algorithm, is based on the introduction of a stationary filter in the sensitivity functions of the Newton algorithm. The convergence of the proposed algorithm is studied and analyzed. A comparison with Newton algorithm is performed to evaluate its performance. The results of the simulations show that the pseudo-output error algorithm converges to true parameters describing the system to be identified. Whereas, the Newton algorithm might converge to a secondary minimum for the same input-output data and initialized parameters. | en_US |
dc.format.extent | 6 p. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | IEEE | en_US |
dc.subject | Sensitivity analysis | en_US |
dc.subject | Convergence of numerical methods | en_US |
dc.subject | Filtering theory | en_US |
dc.subject | Newton method | en_US |
dc.title | A pseudo-output error algorithm to improve global convergence | en_US |
dc.type | Conference Paper | en_US |
dc.relation.conference | Annual Conference of IEEE Industrial Electronics (32nd : 6-10 Nov. 2006 : Paris, France) | en_US |
dc.contributor.affiliation | Department of Electrical Engineering | en_US |
dc.description.startpage | 659 | en_US |
dc.description.endpage | 664 | en_US |
dc.date.catalogued | 2018-05-22 | - |
dc.description.status | Published | en_US |
dc.identifier.ezproxyURL | http://ezsecureaccess.balamand.edu.lb/login?url=https://ieeexplore.ieee.org/document/4153308/ | en_US |
dc.identifier.OlibID | 180498 | - |
dc.relation.ispartoftext | IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics, | en_US |
dc.provenance.recordsource | Olib | en_US |
crisitem.author.parentorg | Faculty of Engineering | - |
Appears in Collections: | Department of Electrical Engineering |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.