Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/755
DC FieldValueLanguage
dc.contributor.authorDaba, Jihad S.en_US
dc.date.accessioned2020-12-23T08:36:18Z-
dc.date.available2020-12-23T08:36:18Z-
dc.date.issued2008-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/755-
dc.description.abstractBiological tissues of physiological systems have different characteristics. As a result, tissues imaged by ultrasound systems have varying degrees of "roughness" with respect to the wavelength of the illuminating radiation. This roughness can be modeled in terms of the locations of the individual elemental scatterers or scattering centers that contribute to the ultrasound backscatter from the tissue. When the number of scatterers within a tissue is very large and the scatterers' distribution occurs on a scale of a wavelength or greater, the speckle is referred to as fully developed. However, many tissue structures have a relatively small number of dominant scatterers within the imaged region. In this case, when the imaged tissue is smooth on the scale of a wavelength, speckle is referred to as partially developed and it can carry useful information about the scattering tissue. In this paper, we derive stochastic models for partially developed multi-look speckle noise. The motivation for this work is the problem of segmentation and tissue classification using ultrasound imaging. Modeling of speckle in this context involves an underlying Poisson point process which modulates a Gram-Charlier series of generalized Laguerre weighted gamma functions, resulting in a doubly stochastic marked accumulator Poisson point process. It is observed that as the mean number of scatterers in a resolution cell or the number of looks is increased, the probability density function of speckle intensity approaches a gamma distribution. This is consistent with fully developed speckle noise as dictated by the Central Limit theorem.en_US
dc.format.extent4 p.en_US
dc.language.isoengen_US
dc.titlePoisson modulated stochastic model for partially developed multi-look speckleen_US
dc.typeConference Paperen_US
dc.relation.conferenceAmerican Conference on Applied Mathematics (24-26 March 2008 : Harvard University, Cambridge, MA, USA)en_US
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.description.startpage209en_US
dc.description.endpage213en_US
dc.date.catalogued2018-02-05-
dc.description.statusPublisheden_US
dc.identifier.OlibID177456-
dc.relation.ispartoftextMATH'08 Proceedings of the American Conference on Applied Mathematicsen_US
dc.provenance.recordsourceOliben_US
crisitem.author.parentorgFaculty of Engineering-
Appears in Collections:Department of Electrical Engineering
Show simple item record

Record view(s)

65
checked on Nov 21, 2024

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.