Please use this identifier to cite or link to this item:
https://scholarhub.balamand.edu.lb/handle/uob/726
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Inaty, Elie | en_US |
dc.contributor.author | Raad, Robert | en_US |
dc.contributor.author | Fortier, Paul | en_US |
dc.contributor.author | Maier, Martin | en_US |
dc.date.accessioned | 2020-12-23T08:35:42Z | - |
dc.date.available | 2020-12-23T08:35:42Z | - |
dc.date.issued | 2011 | - |
dc.identifier.uri | https://scholarhub.balamand.edu.lb/handle/uob/726 | - |
dc.description.abstract | Throughout this paper, a unified analytical framework is presented emphasizing the impact of optical hard limiter (OHL) on the bit-error-rate (BER) performance of the optical overlapped code division multiple access (OV-CDMA) system. Results show that the performance of OV-CDMA system may be highly improved when using OHL. | en_US |
dc.format.extent | 4 p. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | IEEE | en_US |
dc.subject | Optical limiters | en_US |
dc.subject | Error statistics | en_US |
dc.subject.lcsh | Code division multiple access | en_US |
dc.subject.lcsh | Optical communications | en_US |
dc.title | Optical hard limiter impact on the performance analysis of an optical OV-CDMA system | en_US |
dc.type | Conference Paper | en_US |
dc.relation.conference | IEEE EUROCON - International Conference on Computer as a Tool (27-29 April 2011 : Lisbon, Portugal) | en_US |
dc.contributor.affiliation | Department of Electrical Engineering | en_US |
dc.contributor.affiliation | Department of Electrical Engineering | en_US |
dc.description.startpage | 1 | en_US |
dc.description.endpage | 4 | en_US |
dc.date.catalogued | 2018-05-31 | - |
dc.description.status | Published | en_US |
dc.identifier.ezproxyURL | http://ezsecureaccess.balamand.edu.lb/login?url=https://ieeexplore.ieee.org/document/5929211/ | en_US |
dc.identifier.OlibID | 180738 | - |
dc.relation.ispartoftext | IEEE EUROCON - International Conference on Computer as a Tool (EUROCON), 2011 | en_US |
dc.provenance.recordsource | Olib | en_US |
Appears in Collections: | Department of Electrical Engineering |
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