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Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/696
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dc.contributor.authorTzanakos, Georgesen_US
dc.contributor.authorAbche, Antoineen_US
dc.contributor.authorMicheli-Tzanakou, E.en_US
dc.contributor.authorStahl, Theodoreen_US
dc.contributor.authorWan, Xiaomingen_US
dc.contributor.authorYudd, Tonyen_US
dc.date.accessioned2020-12-23T08:35:14Z-
dc.date.available2020-12-23T08:35:14Z-
dc.date.issued2002-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/696-
dc.description.abstractWe have developed a method to implement multimodal 3-D image registration using external markers, visible in both imaging modalities. This method was validated in a controlled mode using simulated images, so that various characteristics of the modalities (e.g. spatial resolution, slice thickness, pixel size) could be convolved with these images. In the present work we apply this method to real images of a given phantom acquired by MRI and SPECT.en_US
dc.format.extent2 p.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.subjectConvolutionen_US
dc.subjectBiomedical MRIen_US
dc.subjectSingle-photon emission computed tomographyen_US
dc.subjectMedical image processingen_US
dc.subjectFunction approximationen_US
dc.subject.lcshImage registrationen_US
dc.titleMultimodal 3-D image registration of MRI - SPECT volume imagesen_US
dc.typeConference Paperen_US
dc.relation.conferenceAnnual International Conference of the IEEE Engineering in Medicine and Biology Society (22nd : 23-28 July 2000 : Chicago, IL, USA)en_US
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.description.startpage1443en_US
dc.description.endpage1444en_US
dc.date.catalogued2018-05-23-
dc.description.statusPublisheden_US
dc.identifier.ezproxyURLhttp://ezsecureaccess.balamand.edu.lb/login?url=https://ieeexplore.ieee.org/document/898013/en_US
dc.identifier.OlibID180560-
dc.relation.ispartoftextProceedings of the 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2000.en_US
dc.provenance.recordsourceOliben_US
crisitem.author.parentorgFaculty of Engineering-
Appears in Collections:Department of Electrical Engineering
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