Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/691
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dc.contributor.authorAbche, Antoineen_US
dc.contributor.authorYaacoub, Fadien_US
dc.contributor.authorHamam, Yskandaren_US
dc.contributor.authorKaram, Elieen_US
dc.date.accessioned2020-12-23T08:35:09Z-
dc.date.available2020-12-23T08:35:09Z-
dc.date.issued2008-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/691-
dc.description.abstractIn this paper, a technique to reconstruct MRI images is proposed and presented. It is based on the decomposition of the collected raw data and the model into real and imaginary components. Then, a corresponding cost (error) function is formed to estimate the image intensities by an optimization procedure based on the conjugate gradient approach. The proposed approach is evaluated and compared with other conventional approaches such as SVD, Conjugate Synthesis, zero-filling and Projection Onto Convex Set (POCS) approaches. The quantitative evaluation is based on three different criteria: the Root Mean Square, the performance test and the Peak Signal to Noise Ratio. The results show that the performance of the proposed approach offers a certain improvement over the other conventional techniques.en_US
dc.format.extent6 p.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.subjectMinimisationen_US
dc.subjectBiomedical MRIen_US
dc.subjectConjugate gradient methodsen_US
dc.subjectImage reconstructionen_US
dc.subjectMean square error methodsen_US
dc.subjectMedical image processingen_US
dc.titleAn MRI image reconstruction approach based on the minimization of a complex normen_US
dc.typeConference Paperen_US
dc.relation.conferenceAnnual Conference of IEEE Industrial Electronics (34th : 10-13 Nov. 2008 : Orlando, FL, USA)en_US
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.description.startpage1839en_US
dc.description.endpage1844en_US
dc.date.catalogued2018-02-16-
dc.description.statusPublisheden_US
dc.identifier.ezproxyURLhttp://ezsecureaccess.balamand.edu.lb/login?url=http://ieeexplore.ieee.org/document/4758235/en_US
dc.identifier.OlibID177827-
dc.relation.ispartoftext34th Annual Conference of the IEEE Industrial Electronics Society (IECON 2008)en_US
dc.provenance.recordsourceOliben_US
crisitem.author.parentorgFaculty of Engineering-
Appears in Collections:Department of Electrical Engineering
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