Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/6526
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dc.contributor.authorDaba, Jihad S.en_US
dc.date.accessioned2023-01-31T09:45:51Z-
dc.date.available2023-01-31T09:45:51Z-
dc.date.issued2022-12-31-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/6526-
dc.description.abstractThis paper presents different stochastic models for entangled UWB fading channels. Closed-form canonical expressions are derived for the statistical distribution of the fading power difference of interfering independent and dependent mixture of flat-fading Rayleigh and Rician channels. The link success probability is derived in terms of the cumulative distribution function of the channel fading power differences. An alternative metric for link success rate (LSR) is developed in terms of the statistical distribution of the ratio of the diffuse powers. Under this alternative formulation, and for the case of 2 independent Rayleigh paths, the LSR statistical distribution was consistent with the heavy-tail Lomax distribution. The scope of future research includes the validation of theoretical and simulated models with real measurements on actual multi-user massive multiple-input-multiple-output (MU-mMIMO) beam-forming sub-6G physical systems.en_US
dc.language.isoengen_US
dc.publisherWorld Scientific and Engineering Academy and Society (WSEAS)en_US
dc.subjectModelsen_US
dc.subjectFadingen_US
dc.subjectUWBen_US
dc.subjectStochasticen_US
dc.subjectLSRen_US
dc.subjectSuben_US
dc.subjectFunctionen_US
dc.subjectRayleighen_US
dc.subjectFormingen_US
dc.titleStochastic Models for the Fading Channel Success Rate of Sub-6G UWB Systemsen_US
dc.typeJournal Articleen_US
dc.identifier.doi10.37394/23201.2022.21.24-
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.description.volume21en_US
dc.description.startpage223en_US
dc.description.endpage230en_US
dc.date.catalogued2023-01-31-
dc.description.statusPublisheden_US
dc.identifier.openURLhttps://wseas.com/journals/cas/2022/a485106-1720.pdfen_US
dc.relation.ispartoftextWseas Transactions on Circuits and Systemsen_US
crisitem.author.parentorgFaculty of Engineering-
Appears in Collections:Department of Electrical Engineering
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