Please use this identifier to cite or link to this item:
https://scholarhub.balamand.edu.lb/handle/uob/622
DC Field | Value | Language |
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dc.contributor.author | Daba, Jihad S. | en_US |
dc.contributor.author | Abdul-Latif, Omar M. | en_US |
dc.date.accessioned | 2020-12-23T08:33:44Z | - |
dc.date.available | 2020-12-23T08:33:44Z | - |
dc.date.issued | 2005 | - |
dc.identifier.uri | https://scholarhub.balamand.edu.lb/handle/uob/622 | - |
dc.description.abstract | Support Vector Machine (SVM) is a statistical learning tool that was initially developed by Vapnik in 1979 and later developed to a more complex concept of structural risk minimization (SRM). SVM is playing an increasing role in applications to detection problems in various engineering problems, notably in statistical signal processing, pattern recognition, image analysis, and communication systems. In this paper, SVM is applied to signal detection in communication systems in the presence of channel noise in the form of fully developed Rayleigh multipath fading and receiver noise generalized as additive color Gaussian noise (ACGN). The structure and performance of SVM in terms of the bit error rate (BER) metric is derived and simulated for these advanced stochastic noise models and the computational complexity of the implementation, in terms of average computational time per bit, is also presented. The performance of SVM is then compared to conventional M-ary signalling optimal model-based detector driven by M-ary phase shift keying (MPSK) modulation. We show that the SVM performance is superior to that of conventional detectors which require as much as 7 bits-coding (M ≥ 128) to produce comparable results to those of SVM. | en_US |
dc.format.extent | 4 p. | en_US |
dc.language.iso | eng | en_US |
dc.subject | Least Square-Support Vector Machine | en_US |
dc.subject | M-ary Phase Shift Keying | en_US |
dc.subject | Fully Developed Rayleigh Fading | en_US |
dc.subject | Colour noise | en_US |
dc.title | Improved M-ary signal detection using support vector machine classifiers | en_US |
dc.type | Conference Paper | en_US |
dc.relation.conference | International Enformatika Conference (IEC) (26-28 August 2005 : Prague, Czech Republic) | en_US |
dc.contributor.affiliation | Department of Electrical Engineering | en_US |
dc.description.startpage | 264 | en_US |
dc.description.endpage | 268 | en_US |
dc.date.catalogued | 2018-02-05 | - |
dc.description.status | Published | en_US |
dc.identifier.OlibID | 177484 | - |
dc.identifier.openURL | https://pdfs.semanticscholar.org/a9e9/4c90a1922928f01a2a86ffb047c7bbf3d27d.pdf | en_US |
dc.relation.ispartoftext | Proceedings of World Academy of Science, Engineering and Technology | en_US |
dc.provenance.recordsource | Olib | en_US |
crisitem.author.parentorg | Faculty of Engineering | - |
Appears in Collections: | Department of Electrical Engineering |
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