Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/2572
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dc.contributor.authorDaba, Jihad S.en_US
dc.date.accessioned2020-12-23T09:15:52Z-
dc.date.available2020-12-23T09:15:52Z-
dc.date.issued2017-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/2572-
dc.description.abstractUnderstanding the statistics of non-isotropic scattering multipath channels that fade randomly with respect to time, frequency, and space in a mobile environment is very crucial for the accurate detection of received signals in wireless and cellular communication systems. In this paper, we derive stochastic models for the probability density function (PDF) of the shift in the carrier frequency caused by the Doppler Effect on the received illuminating signal in the presence of a dominant line of sight. Our derivation is based on a generalized Clarkes and a two-wave partially developed scattering models, where the statistical distribution of the frequency shift is shown to be consistent with the power spectral density of the Doppler shifted signal.en_US
dc.language.isoengen_US
dc.subjectDoppler shifen_US
dc.subjectFiltered Poisson processen_US
dc.subjectGeneralized Clarks modelen_US
dc.subjectNon-isotropic scatteringen_US
dc.subjectPartially developed scatteringen_US
dc.subjectRician distributionen_US
dc.titleStatistical modeling of mobile fading channels based on triply stochastic filtered marked poisson point processesen_US
dc.typeJournal Articleen_US
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.description.volume11en_US
dc.description.issue1en_US
dc.description.startpage83en_US
dc.description.endpage87en_US
dc.date.catalogued2017-11-10-
dc.description.statusPublisheden_US
dc.identifier.OlibID174901-
dc.identifier.openURLhttps://core.ac.uk/download/pdf/144730011.pdfen_US
dc.relation.ispartoftextInternational journal of electronics and communication engineeringen_US
dc.provenance.recordsourceOliben_US
crisitem.author.parentorgFaculty of Engineering-
Appears in Collections:Department of Electrical Engineering
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