Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/2491
DC FieldValueLanguage
dc.contributor.authorAtie, Elie M.en_US
dc.contributor.authorXie, Zhihuaen_US
dc.contributor.authorEter, Ali Elen_US
dc.contributor.authorSalut, Rolanden_US
dc.contributor.authorNedeljkovic, Dusanen_US
dc.contributor.authorTannous, Tonyen_US
dc.contributor.authorBaida, Fadi I.en_US
dc.contributor.authorThierry, Grosjeanen_US
dc.date.accessioned2020-12-23T09:14:21Z-
dc.date.available2020-12-23T09:14:21Z-
dc.date.issued2015-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/2491-
dc.description.abstractPlasmonic nano-antennas have proven the outstanding ability of sensing chemical and physical processes down to the nanometer scale. Sensing is usually achieved within the highly confined optical fields generated resonantly by the nano-antennas, i.e., in contact to the nanostructures. In this paper, we demonstrate the sensing capability of nano-antennas to their larger scale environment, well beyond their plasmonic confinement volume, leading to the concept of "remote" (non contact) sensing on the nanometer scale. On the basis of a bowtie-aperture nano-antenna (BNA) integrated at the apex of a SNOM (Scanning Near-field Optical Microscopy) fiber tip, we introduce an ultra-compact, moveable, and background-free optical nanosensor for the remote sensing of a silicon surface (up to distance of 300 nm). Sensitivity of the BNA to its large scale environment is high enough to expect the monitoring and control of the spacing between the nano-antenna and a silicon surface with sub-nanometer accuracy. This work paves the way towards an alternative class of nanopositioning techniques, based on the monitoring of diffraction-free plasmon resonance, that are alternative to nanomechanical and diffraction-limited optical interference-based devices.en_US
dc.language.isoengen_US
dc.titleRemote optical sensing on the nanometer scale with a bowtie aperture nano-antenna on a fiber tip of scanning near-field optical microscopyen_US
dc.typeJournal Articleen_US
dc.contributor.affiliationDepartment of Physicsen_US
dc.description.volume106en_US
dc.description.issue15en_US
dc.date.catalogued2017-11-16-
dc.description.statusPublisheden_US
dc.identifier.OlibID175025-
dc.relation.ispartoftextJournal of applied physics lettersen_US
dc.provenance.recordsourceOliben_US
Appears in Collections:Department of Physics
Show simple item record

Record view(s)

39
checked on Apr 23, 2024

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.