Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/2155
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dc.contributor.authorTohme, Elie Tonien_US
dc.contributor.authorOuvrard, Regisen_US
dc.contributor.authorPoinot, Thierryen_US
dc.contributor.authorTrigeassou, Jean Claudeen_US
dc.contributor.authorAbche, Antoineen_US
dc.date.accessioned2020-12-23T09:07:36Z-
dc.date.available2020-12-23T09:07:36Z-
dc.date.issued2009-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/2155-
dc.description.abstractThe main disadvantage of the Output-Error (OE) identification methods is that they may converge to a secondary optimum. A good initialization converges to the global optimum. The ARX model is often selected as initialization step to OE algorithms. However, the ARX model may be too biased and may not lead to a good initialization. This paper presents an approach based on the Reinitialized Partial Moment (RPM) to obtain a good initialization for OE methods. The RPM model presents an implicit filter that replaces the necessary explicit filter required by the ARX model. The result are encouraging and they have shown that the RPM based approach has to lead to a better initialization than the conventional techniques.en_US
dc.format.extent6 p.en_US
dc.language.isoengen_US
dc.subjectARX modelen_US
dc.subjectGlobal convergenceen_US
dc.subjectInitialization of output-error methodsen_US
dc.subjectReinitialized partial momentsen_US
dc.subjectRPM modelen_US
dc.titleInitialization of output-error identification methods - Comparison between ARX and RPM modelsen_US
dc.typeJournal Articleen_US
dc.identifier.doi10.3182/20090706-3-FR-2004.00049-
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.description.volume42en_US
dc.description.issue10en_US
dc.description.startpage302en_US
dc.description.endpage307en_US
dc.date.catalogued2018-05-18-
dc.description.statusPublisheden_US
dc.identifier.ezproxyURLhttp://ezsecureaccess.balamand.edu.lb/login?url=https://doi.org/10.3182/20090706-3-FR-2004.00049en_US
dc.identifier.OlibID180415-
dc.relation.ispartoftextIFAC proceedings volumesen_US
dc.provenance.recordsourceOliben_US
crisitem.author.parentorgFaculty of Engineering-
Appears in Collections:Department of Electrical Engineering
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