Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/558
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dc.contributor.authorAyoubi, Raficen_US
dc.contributor.authorZiade, Haissamen_US
dc.contributor.authorBayoumi, Magdy A.en_US
dc.date.accessioned2020-12-23T08:32:28Z-
dc.date.available2020-12-23T08:32:28Z-
dc.date.issued2003-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/558-
dc.description.abstractThe associative Hopfield memory, is a very useful artificial neural network (ANN) that can be utilized in numerous applications. Examples include, pattern recognition, noise removal, information retrieval, and combinatorial optimization problems. This paper provides an efficient and fault tolerant algorithm for implementing the Hopfield ANN on a torus parallel architecture. The main advantage of this algorithm is fault tolerance, high performance, and cost effectiveness. The developed algorithm is much faster than other known algorithms of its class and comparable in speed to more complex architectures such as the hypercube without the added cost. It requires O(1) multiplications and O(log N) additions, whereas most others require O(N) multiplications and O(N) additions. Moreover, the developed algorithm has an added advantage over other known algorithms due to its fault tolerance feature, which is based on ABFT techniques. The main advantage of our ABFT (algorithm-based fault tolerance) method over other existing ABFT methods is its ability to detect and correct several faults without any additional hardware overhead (i.e. no extra row or column is needed).en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.subjectDigital arithmeticen_US
dc.subjectHopfield neural netsen_US
dc.subjectFault toleranceen_US
dc.subjectContent-addressable storageen_US
dc.subjectParallel architecturesen_US
dc.titleFault tolerant hopfield associative memory on torusen_US
dc.typeConference Paperen_US
dc.relation.conferenceIEEE Symposium on Defect and Fault Tolerance in VLSI Systems (18th : 5-5 Nov. 2003 : Boston, MA, USA, USA)en_US
dc.contributor.affiliationDepartment of Computer Engineeringen_US
dc.date.catalogued2018-01-11-
dc.description.statusPublisheden_US
dc.identifier.ezproxyURLhttp://ezsecureaccess.balamand.edu.lb/login?url=http://ieeexplore.ieee.org/document/1250133/en_US
dc.identifier.OlibID176322-
dc.relation.ispartoftextProceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systemsen_US
dc.provenance.recordsourceOliben_US
crisitem.author.parentorgFaculty of Engineering-
Appears in Collections:Department of Computer Engineering
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