Please use this identifier to cite or link to this item: https://scholarhub.balamand.edu.lb/handle/uob/2102
DC FieldValueLanguage
dc.contributor.authorInaty, Elieen_US
dc.contributor.authorRaad, Roberten_US
dc.contributor.authorTablieh, Nicoleen_US
dc.date.accessioned2020-12-23T09:06:22Z-
dc.date.available2020-12-23T09:06:22Z-
dc.date.issued2011-
dc.identifier.urihttps://scholarhub.balamand.edu.lb/handle/uob/2102-
dc.description.abstractThroughout this paper, a closed form expression of the multiple access interference (MAI) limited bit error rate (BER) is provided for the multiwavelength optical code-division multiple-access system when the system is working above the nominal transmission rate limit imposed by the passive encoding-decoding operation. This system is known in literature as the optical overlapped code division multiple access (OV-CDMA) system. A unified analytical framework is presented emphasizing the impact of optical hard limiter (OHL) on the BER performance of such a system. Results show that the performance of the OV-CDMA system may be highly improved when using OHL preprocessing at the receiver side.en_US
dc.format.extent5 p.en_US
dc.language.isoengen_US
dc.subjectMulti-wavelength OCDMAen_US
dc.subjectFiber Bragg grating (FBG)en_US
dc.subjectMultirateen_US
dc.subjectOverlapping coefficienten_US
dc.titleImpact of optical hard limiter on the performance of an optical overlapped-code division multiple access systemen_US
dc.typeJournal Articleen_US
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.contributor.affiliationDepartment of Electrical Engineeringen_US
dc.description.volume50en_US
dc.description.issue8en_US
dc.description.startpage058003-1en_US
dc.description.endpage085003-5en_US
dc.date.catalogued2017-11-16-
dc.description.statusPublisheden_US
dc.identifier.ezproxyURLhttp://ezsecureaccess.balamand.edu.lb/login?url=http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5929211en_US
dc.identifier.OlibID175011-
dc.relation.ispartoftextSpie journal of optical engineeringen_US
dc.provenance.recordsourceOliben_US
Appears in Collections:Department of Electrical Engineering
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